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BibTeX record conf/vts/MrugalskiTR00
@inproceedings{DBLP:conf/vts/MrugalskiTR00, author = {Grzegorz Mrugalski and Jerzy Tyszer and Janusz Rajski}, title = {Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators}, booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000, Montreal, Canada}, pages = {377--388}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/VTEST.2000.843868}, doi = {10.1109/VTEST.2000.843868}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/MrugalskiTR00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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