BibTeX record conf/vts/MozaffariBSSFVM22

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@inproceedings{DBLP:conf/vts/MozaffariBSSFVM22,
  author       = {Seyed Nima Mozaffari and
                  Bonita Bhaskaran and
                  Shantanu Sarangi and
                  Suhas M. Satheesh and
                  Kuo Lin Fu and
                  Nithin Valentine and
                  P. Manikandan and
                  Mahmut Yilmaz},
  title        = {On-Die Noise Measurement During Automatic Test Equipment {(ATE)} Testing
                  and In-System-Test {(IST)}},
  booktitle    = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
                  April 25-27, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/VTS52500.2021.9794251},
  doi          = {10.1109/VTS52500.2021.9794251},
  timestamp    = {Tue, 28 Jun 2022 21:08:29 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/MozaffariBSSFVM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}