@inproceedings{DBLP:conf/vts/Mohanram05,
author = {Kartik Mohanram},
title = {Closed-Form Simulation and Robustness Models for SEU-Tolerant
Design},
booktitle = {VTS},
year = {2005},
pages = {327-333},
ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.35},
crossref = {DBLP:conf/vts/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/vts/2005,
title = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005,
Palm Springs, CA, USA},
booktitle = {VTS},
publisher = {IEEE Computer Society},
year = {2005},
isbn = {0-7695-2314-5},
bibsource = {DBLP, http://dblp.uni-trier.de}
}