BibTeX record conf/vts/MiyaseAOWFYEK12

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@inproceedings{DBLP:conf/vts/MiyaseAOWFYEK12,
  author       = {Kohei Miyase and
                  Masao Aso and
                  Ryou Ootsuka and
                  Xiaoqing Wen and
                  Hiroshi Furukawa and
                  Yuta Yamato and
                  Kazunari Enokimoto and
                  Seiji Kajihara},
  title        = {A novel capture-safety checking method for multi-clock designs and
                  accuracy evaluation with delay capture circuits},
  booktitle    = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
                  23-26 April 2012},
  pages        = {197--202},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/VTS.2012.6231102},
  doi          = {10.1109/VTS.2012.6231102},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/MiyaseAOWFYEK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}