Edward J. McCluskey Ahmad A. Al-Yamani Chien-Mo James Li Chao-Wen Tseng Erik H. Volkerink François-Fabien Ferhani Edward Li Subhasish Mitra ELF-Murphy Data on Defects and Test Sets. 16-22 2004 conf/vts/2004 VTS http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340016abs.htm db/conf/vts/vts2004.html#McCluskeyALTVFLM04