DBLP Record 'conf/vts/McCluskeyALTVFLM04'

BibTeX

@inproceedings{DBLP:conf/vts/McCluskeyALTVFLM04,
  author    = {Edward J. McCluskey and
               Ahmad A. Al-Yamani and
               Chien-Mo James Li and
               Chao-Wen Tseng and
               Erik H. Volkerink and
               Fran\c{c}ois-Fabien Ferhani and
               Edward Li and
               Subhasish Mitra},
  title     = {ELF-Murphy Data on Defects and Test Sets},
  booktitle = {VTS},
  year      = {2004},
  pages     = {16-22},
  ee        = {http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340016abs.htm},
  crossref  = {DBLP:conf/vts/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2004,
  title     = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004,
               Napa Valley, CA, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2134-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}