Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.

Robert Madge Manu Rehani Kevin Cota W. Robert Daasch Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. 69-74 2002 conf/vts/2002 VTS http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011113 db/conf/vts/vts2002.html#MadgeRCD02