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BibTeX record conf/vts/MadgeRCD02
@inproceedings{DBLP:conf/vts/MadgeRCD02, author = {Robert Madge and Manu Rehani and Kevin Cota and W. Robert Daasch}, title = {Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies}, booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}}, pages = {69--74}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/VTS.2002.1011113}, doi = {10.1109/VTS.2002.1011113}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/MadgeRCD02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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