BibTeX record conf/vts/LiuNO06

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@inproceedings{DBLP:conf/vts/LiuNO06,
  author       = {Fang Liu and
                  Plamen K. Nikolov and
                  Sule Ozev},
  title        = {Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework},
  booktitle    = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
                  Berkeley, California, {USA}},
  pages        = {272--277},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/VTS.2006.54},
  doi          = {10.1109/VTS.2006.54},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LiuNO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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