Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency Clocking.

Chunsheng Liu Vikram Iyengar Dhiraj K. Pradhan Thermal-Aware Testing of Network-on-Chip Using Multiple-Frequency Clocking. 46-51 2006 conf/vts/2006 VTS http://doi.ieeecomputersociety.org/10.1109/VTS.2006.88 db/conf/vts/vts2006.html#LiuIP06