Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation.

Hsing-Chung Liang Chung-Len Lee Jwu E. Chen Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation. 341-347 1998 conf/vts/1998 VTS http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360341.pdf db/conf/vts/vts1998.html#LiangLC98