BibTeX record conf/vts/LiWG22

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@inproceedings{DBLP:conf/vts/LiWG22,
  author       = {Mingye Li and
                  Fangzhou Wang and
                  Sandeep Gupta},
  title        = {Methods for testing path delay and static faults in {RSFQ} circuits},
  booktitle    = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
                  April 25-27, 2022},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/VTS52500.2021.9794245},
  doi          = {10.1109/VTS52500.2021.9794245},
  timestamp    = {Fri, 22 Sep 2023 10:12:26 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/LiWG22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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