BibTeX record conf/vts/LiL05

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@inproceedings{DBLP:conf/vts/LiL05,
  author       = {Jin{-}Fu Li and
                  Chou{-}Kun Lin},
  title        = {Modeling and Testing Comparison Faults for Ternary Content Addressable
                  Memories},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {60--65},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.57},
  doi          = {10.1109/VTS.2005.57},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/LiL05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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