BibTeX record conf/vts/LeeWTC17

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@inproceedings{DBLP:conf/vts/LeeWTC17,
  author       = {Kao{-}Chi Lee and
                  Kai{-}Chiang Wu and
                  Chih{-}Ying Tsai and
                  Mango Chia{-}Tso Chao},
  title        = {Fast {WAT} test structure for measuring Vt variance based on latch-based
                  comparators},
  booktitle    = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
                  April 9-12, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/VTS.2017.7928928},
  doi          = {10.1109/VTS.2017.7928928},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LeeWTC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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