LeeNA98'

BibTeX

@inproceedings{DBLP:conf/vts/LeeNA98,
  author    = {Kyung Tek Lee and
               Clay Nordquist and
               Jacob A. Abraham},
  title     = {Automatic Test Pattern Generation for Crosstalk Glitches
               in Digital Circuits},
  booktitle = {VTS},
  year      = {1998},
  pages     = {34-41},
  ee        = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360034.pdf},
  crossref  = {DBLP:conf/vts/1998},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/1998,
  title     = {16th IEEE VLSI Test Symposium (VTS '98), 28 April - 1 May
               1998, Princeton, NJ, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {1998},
  isbn      = {0-8186-8436-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}