BibTeX record conf/vts/KhocheB97

download as .bib file

@inproceedings{DBLP:conf/vts/KhocheB97,
  author       = {Ajay Khoche and
                  Erik Brunvand},
  title        = {Critical hazard free test generation for asynchronous circuits},
  booktitle    = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
                  Monterey, California, {USA}},
  pages        = {203--209},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/VTEST.1997.600270},
  doi          = {10.1109/VTEST.1997.600270},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/KhocheB97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.