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BibTeX record conf/vts/KhalilW01
@inproceedings{DBLP:conf/vts/KhalilW01, author = {Mohammad Athar Khalil and Chin{-}Long Wey}, title = {High-Voltage Stress Test Paradigms of Analog {CMOS} ICs for Gate-Oxide Reliability Enhancement}, booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, {USA}}, pages = {333--338}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/VTS.2001.923458}, doi = {10.1109/VTS.2001.923458}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/KhalilW01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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