BibTeX record conf/vts/IwasakiAFMMKKML20

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@inproceedings{DBLP:conf/vts/IwasakiAFMMKKML20,
  author       = {Takeshi Iwasaki and
                  Masao Aso and
                  Haruji Futami and
                  Satoshi Matsunaga and
                  Yousuke Miyake and
                  Takaaki Kato and
                  Seiji Kajihara and
                  Yukiya Miura and
                  Smith Lai and
                  Gavin Hung and
                  Harry H. Chen and
                  Haruo Kobayashi and
                  Kazumi Hatayama},
  title        = {Innovative Test Practices in Asia},
  booktitle    = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
                  April 5-8, 2020},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VTS48691.2020.9107640},
  doi          = {10.1109/VTS48691.2020.9107640},
  timestamp    = {Fri, 09 Apr 2021 18:37:31 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/IwasakiAFMMKKML20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}