BibTeX record conf/vts/IngermannF93

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@inproceedings{DBLP:conf/vts/IngermannF93,
  author       = {Erik H. Ingermann and
                  James F. Frenzel},
  title        = {Sensitivity analysis of a radiation immune {CMOS} logic family under
                  defect conditions},
  booktitle    = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
                  Atlantic City, NJ, {USA}},
  pages        = {355--357},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/VTEST.1993.313378},
  doi          = {10.1109/VTEST.1993.313378},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/IngermannF93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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