BibTeX record conf/vts/HutnerSVAC20

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@inproceedings{DBLP:conf/vts/HutnerSVAC20,
  author       = {Marc Hutner and
                  R. Sethuram and
                  Bapi Vinnakota and
                  Dave Armstrong and
                  A. Copperhall},
  title        = {Special Session: Test Challenges in a Chiplet Marketplace},
  booktitle    = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
                  April 5-8, 2020},
  pages        = {1--12},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VTS48691.2020.9107636},
  doi          = {10.1109/VTS48691.2020.9107636},
  timestamp    = {Mon, 18 Jul 2022 20:00:24 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/HutnerSVAC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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