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BibTeX record conf/vts/HuiN92
@inproceedings{DBLP:conf/vts/HuiN92, author = {Michael M. Y. Hui and Benoit Nadeau{-}Dostie}, title = {Scan testing of latch arrays}, booktitle = {10th {IEEE} {VLSI} Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, {USA}}, pages = {31--36}, publisher = {{IEEE} Computer Society}, year = {1992}, url = {https://doi.org/10.1109/VTEST.1992.232720}, doi = {10.1109/VTEST.1992.232720}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/HuiN92.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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