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BibTeX record conf/vts/HouL13
@inproceedings{DBLP:conf/vts/HouL13, author = {Chih{-}Sheng Hou and Jin{-}Fu Li}, title = {Allocation of {RAM} built-in self-repair circuits for {SOC} dies of 3D ICs}, booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA, April 29 - May 2, 2013}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/VTS.2013.6548940}, doi = {10.1109/VTS.2013.6548940}, timestamp = {Tue, 17 Oct 2023 15:22:33 +0200}, biburl = {https://dblp.org/rec/conf/vts/HouL13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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