BibTeX record conf/vts/HouL13

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@inproceedings{DBLP:conf/vts/HouL13,
  author       = {Chih{-}Sheng Hou and
                  Jin{-}Fu Li},
  title        = {Allocation of {RAM} built-in self-repair circuits for {SOC} dies of
                  3D ICs},
  booktitle    = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
                  April 29 - May 2, 2013},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/VTS.2013.6548940},
  doi          = {10.1109/VTS.2013.6548940},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/HouL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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