BibTeX record conf/vts/HePNVJT19

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@inproceedings{DBLP:conf/vts/HePNVJT19,
  author       = {Miao Tony He and
                  Jungmin Park and
                  Adib Nahiyan and
                  Apostol Vassilev and
                  Yier Jin and
                  Mark M. Tehranipoor},
  title        = {{RTL-PSC:} Automated Power Side-Channel Leakage Assessment at Register-Transfer
                  Level},
  booktitle    = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VTS.2019.8758600},
  doi          = {10.1109/VTS.2019.8758600},
  timestamp    = {Sat, 09 Apr 2022 12:35:39 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/HePNVJT19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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