A practical approach to instruction-based test generation for functional modules of VLSI processors.

Kazumi Hatayama Kazunori Hikone T. Miyazaki H. Yamada A practical approach to instruction-based test generation for functional modules of VLSI processors. 17-23 1997 conf/vts/1997 VTS http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100017abs.htm db/conf/vts/vts1997.html#HatayamaHMY97