BibTeX record conf/vts/HartantoBPF97

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@inproceedings{DBLP:conf/vts/HartantoBPF97,
  author       = {Ismed Hartanto and
                  Vamsi Boppana and
                  Janak H. Patel and
                  W. Kent Fuchs},
  title        = {Diagnostic Test Pattern Generation for Sequential Circuits},
  booktitle    = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
                  Monterey, California, {USA}},
  pages        = {196--202},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/VTEST.1997.600264},
  doi          = {10.1109/VTEST.1997.600264},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HartantoBPF97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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