BibTeX record conf/vts/GuoMALSV06

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@inproceedings{DBLP:conf/vts/GuoMALSV06,
  author       = {Ruifeng Guo and
                  Subhasish Mitra and
                  M. Enamul Amyeen and
                  Jinkyu Lee and
                  Srihari Sivaraj and
                  Srikanth Venkataraman},
  title        = {Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and
                  Gate Exhaustive},
  booktitle    = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
                  Berkeley, California, {USA}},
  pages        = {66--71},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/VTS.2006.34},
  doi          = {10.1109/VTS.2006.34},
  timestamp    = {Sun, 04 Aug 2024 19:41:55 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/GuoMALSV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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