DBLP Record 'conf/vts/GotoNI97'

BibTeX

@inproceedings{DBLP:conf/vts/GotoNI97,
  author    = {H. Goto and
               S. Nakamura and
               K. Iwasaki},
  title     = {Experimental fault analysis of 1 Mb SRAM chips},
  booktitle = {VTS},
  year      = {1997},
  pages     = {31-36},
  ee        = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100031abs.htm},
  crossref  = {DBLP:conf/vts/1997},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/1997,
  title     = {15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1,
               1997, Monterey, California, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {1997},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}