BibTeX record conf/vts/GomezXCVDG20

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@inproceedings{DBLP:conf/vts/GomezXCVDG20,
  author       = {Jhon Gomez and
                  Nektar Xama and
                  Anthony Coyette and
                  Ronny Vanhooren and
                  Wim Dobbelaere and
                  Georges G. E. Gielen},
  title        = {Pinhole Latent Defect Modeling and Simulation for Defect-Oriented
                  Analog/Mixed-Signal Testing},
  booktitle    = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
                  April 5-8, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VTS48691.2020.9107625},
  doi          = {10.1109/VTS48691.2020.9107625},
  timestamp    = {Thu, 14 Oct 2021 09:52:09 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/GomezXCVDG20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}