FerhaniSMN08'

@inproceedings{DBLP:conf/vts/FerhaniSMN08,
  author    = {Fran\c{c}ois-Fabien Ferhani and
               Nirmal R. Saxena and
               Edward J. McCluskey and
               Phil Nigh},
  title     = {How Many Test Patterns are Useless?},
  booktitle = {VTS},
  year      = {2008},
  pages     = {23-28},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.27},
  crossref  = {DBLP:conf/vts/2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2008,
  title     = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May
               1, 2008, San Diego, California, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}