BibTeX record: conf/vts/FerhaniSMN08

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@inproceedings{DBLP:conf/vts/FerhaniSMN08,
  author    = {Fran{\c{c}}ois{-}Fabien Ferhani and
               Nirmal R. Saxena and
               Edward J. McCluskey and
               Phil Nigh},
  title     = {How Many Test Patterns are Useless?},
  booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
               2008, San Diego, California, {USA}},
  year      = {2008},
  pages     = {23--28},
  crossref  = {DBLP:conf/vts/2008},
  url       = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.27},
  doi       = {10.1109/VTS.2008.27},
  timestamp = {Tue, 21 Oct 2014 09:57:02 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/FerhaniSMN08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/2008,
  title     = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
               2008, San Diego, California, {USA}},
  year      = {2008},
  publisher = {{IEEE} Computer Society},
  timestamp = {Tue, 21 Oct 2014 09:57:02 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/2008},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}