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BibTeX record conf/vts/FangHB21
@inproceedings{DBLP:conf/vts/FangHB21, author = {Chenlei Fang and Qicheng Huang and R. D. Shawn Blanton}, title = {Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis}, booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA, April 25-28, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/VTS50974.2021.9441003}, doi = {10.1109/VTS50974.2021.9441003}, timestamp = {Wed, 09 Jun 2021 09:00:34 +0200}, biburl = {https://dblp.org/rec/conf/vts/FangHB21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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