BibTeX record conf/vts/FangHB21

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@inproceedings{DBLP:conf/vts/FangHB21,
  author       = {Chenlei Fang and
                  Qicheng Huang and
                  R. D. Shawn Blanton},
  title        = {Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis},
  booktitle    = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
                  April 25-28, 2021},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VTS50974.2021.9441003},
  doi          = {10.1109/VTS50974.2021.9441003},
  timestamp    = {Wed, 09 Jun 2021 09:00:34 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/FangHB21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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