BibTeX
@inproceedings{DBLP:conf/vts/ErdoganO08,
author = {Erdem Serkan Erdogan and
Sule Ozev},
title = {Single-Measurement Diagnostic Test Method for Parametric
Faults of I/Q Modulating RF Transceivers},
booktitle = {VTS},
year = {2008},
pages = {209-214},
ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.39},
crossref = {DBLP:conf/vts/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/vts/2008,
title = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May
1, 2008, San Diego, California, USA},
booktitle = {VTS},
publisher = {IEEE Computer Society},
year = {2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-05-07 by Michael Ley (ley@uni-trier.de)