BibTeX record conf/vts/ErbSSRB15

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@inproceedings{DBLP:conf/vts/ErbSSRB15,
  author       = {Dominik Erb and
                  Karsten Scheibler and
                  Matthias Sauer and
                  Sudhakar M. Reddy and
                  Bernd Becker},
  title        = {Multi-cycle Circuit Parameter Independent {ATPG} for interconnect
                  open defects},
  booktitle    = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
                  27-29, 2015},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/VTS.2015.7116296},
  doi          = {10.1109/VTS.2015.7116296},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ErbSSRB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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