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BibTeX record conf/vts/EdirisooriyaE95
@inproceedings{DBLP:conf/vts/EdirisooriyaE95, author = {Samantha Edirisooriya and Geetani Edirisooriya}, title = {Diagnosis of scan path failures}, booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995, Princeton, New Jersey, {USA}}, pages = {250--255}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/VTEST.1995.512645}, doi = {10.1109/VTEST.1995.512645}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/EdirisooriyaE95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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