Sunghoon Chun Taejin Kim YongJoon Kim Sungho Kang An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. 73-78 2008 VTS http://doi.ieeecomputersociety.org/10.1109/VTS.2008.61 conf/vts/2008 db/conf/vts/vts2008.html#ChunKKK08