A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study.

Hugo Cheung Sandeep K. Gupta A Framework to Minimize Test Escape and Yield Loss during IDDQ Testing: A Case Study. 89-96 2000 conf/vts/2000 VTS http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843831 db/conf/vts/vts2000.html#CheungG00