BibTeX record conf/vts/ChenWK10

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@inproceedings{DBLP:conf/vts/ChenWK10,
  author       = {Po{-}Yuan Chen and
                  Cheng{-}Wen Wu and
                  Ding{-}Ming Kwai},
  title        = {On-chip testing of blind and open-sleeve TSVs for 3D {IC} before bonding},
  booktitle    = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
                  Santa Cruz, California, {USA}},
  pages        = {263--268},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/VTS.2010.5469559},
  doi          = {10.1109/VTS.2010.5469559},
  timestamp    = {Sat, 30 Sep 2023 09:58:40 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ChenWK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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