DBLP Record 'conf/vts/ChenMRKK01'

BibTeX

@inproceedings{DBLP:conf/vts/ChenMRKK01,
  author    = {John T. Chen and
               Wojciech Maly and
               Janusz Rajski and
               Omar Kebichi and
               Jitendra Khare},
  title     = {Enabling Embedded Memory Diagnosis via Test Response Compression},
  booktitle = {VTS},
  year      = {2001},
  pages     = {292-298},
  ee        = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220292abs.htm},
  crossref  = {DBLP:conf/vts/2001},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2001,
  title     = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del
               Rey, CA, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2001},
  isbn      = {0-7695-1122-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}