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BibTeX record conf/vts/ChenKKM08
@inproceedings{DBLP:conf/vts/ChenKKM08, author = {Tze Wee Chen and Kyunglok Kim and Young Moon Kim and Subhasish Mitra}, title = {Gate-Oxide Early Life Failure Prediction}, booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1, 2008, San Diego, California, {USA}}, pages = {111--118}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/VTS.2008.55}, doi = {10.1109/VTS.2008.55}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/ChenKKM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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