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BibTeX record conf/vts/Chau93
@inproceedings{DBLP:conf/vts/Chau93, author = {Savio N. Chau}, title = {Fault injection scan design for enhanced {VLSI} design verification}, booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, {USA}}, pages = {109--111}, publisher = {{IEEE} Computer Society}, year = {1993}, url = {https://doi.org/10.1109/VTEST.1993.313299}, doi = {10.1109/VTEST.1993.313299}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/Chau93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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