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BibTeX record conf/vts/ChakravartySGBA20
@inproceedings{DBLP:conf/vts/ChakravartySGBA20, author = {Sreejit Chakravarty and Fei Su and Indira A. Gohad and Sudheer V. Bandana and B. S. Adithya and Wei Ming Lim}, title = {Internal {I/O} Testing: Definition and a Solution}, booktitle = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA, April 5-8, 2020}, pages = {1--6}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/VTS48691.2020.9107567}, doi = {10.1109/VTS48691.2020.9107567}, timestamp = {Thu, 25 Jun 2020 15:54:32 +0200}, biburl = {https://dblp.org/rec/conf/vts/ChakravartySGBA20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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