BibTeX record conf/vts/CamuratiPRBBM94

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@inproceedings{DBLP:conf/vts/CamuratiPRBBM94,
  author       = {Paolo Camurati and
                  Paolo Prinetto and
                  Matteo Sonza Reorda and
                  Stefano Barbagallo and
                  Andrea Burri and
                  Davide Medina},
  title        = {An industrial experience in the built-in self test of embedded RAMs},
  booktitle    = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
                  Hill, New Jersey, {USA}},
  pages        = {306--311},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/VTEST.1994.292296},
  doi          = {10.1109/VTEST.1994.292296},
  timestamp    = {Mon, 26 Jun 2023 20:47:12 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/CamuratiPRBBM94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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