R. L. Campbell P. Kuekes David Y. Lepejian W. Maly Michael Nicolaidis Alex Orailoglu Can Defect-Tolerant Chips Better Meet the Quality Challenge? 362-363 1996 conf/vts/1996 VTS http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040362.pdf db/conf/vts/vts1996.html#CampbellKLMNO96