BibTeX record conf/vts/BiswasDB04

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@inproceedings{DBLP:conf/vts/BiswasDB04,
  author       = {Sounil Biswas and
                  Kumar N. Dwarakanath and
                  R. D. (Shawn) Blanton},
  title        = {Generalized Sensitization using Fault Tuples},
  booktitle    = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
                  Napa Valley, CA, {USA}},
  pages        = {297--303},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/VTEST.2004.1299256},
  doi          = {10.1109/VTEST.2004.1299256},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BiswasDB04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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