BibTeX
@inproceedings{DBLP:conf/vts/AzimaneM04,
author = {Mohamed Azimane and
Ananta K. Majhi},
title = {New Test Methodology for Resistive Open Defect Detection
in Memory Address Decoders},
booktitle = {VTS},
year = {2004},
pages = {123-128},
ee = {http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340123abs.htm},
crossref = {DBLP:conf/vts/2004},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/vts/2004,
title = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004,
Napa Valley, CA, USA},
booktitle = {VTS},
publisher = {IEEE Computer Society},
year = {2004},
isbn = {0-7695-2134-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-06-21 by Michael Ley (ley@uni-trier.de)