BibTeX record: conf/vts/AmyeenFPB01

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@inproceedings{DBLP:conf/vts/AmyeenFPB01,
  author    = {Enamul Amyeen and
               W. Kent Fuchs and
               Irith Pomeranz and
               Vamsi Boppana},
  title     = {Fault Equivalence Identification Using Redundancy Information and
               Static and Dynamic Extraction.},
  booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  year      = {2001},
  pages     = {124--130},
  crossref  = {DBLP:conf/vts/2001},
  url       = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923428},
  doi       = {10.1109/VTS.2001.923428},
  timestamp = {Tue, 02 Sep 2014 21:35:51 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/AmyeenFPB01},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/2001,
  title     = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  year      = {2001},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7695-1122-8},
  timestamp = {Tue, 02 Sep 2014 21:35:51 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/2001},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}