<?xml version="1.0"?>
<dblp>
<proceedings key="conf/vts/2001" mdate="2004-07-09">
<title>19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA</title>
<booktitle>VTS</booktitle>
<publisher>IEEE Computer Society</publisher>
<year>2001</year>
<isbn>0-7695-1122-8</isbn>
<url>db/conf/vts/vts2001.html</url>
</proceedings>

</dblp>
