BibTeX record conf/vlsit/YangWSYYWCLTCH22

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@inproceedings{DBLP:conf/vlsit/YangWSYYWCLTCH22,
  author       = {Chang{-}Feng Yang and
                  Chun{-}Yu Wu and
                  Meng{-}Chun Shih and
                  Ming{-}Ta Yang and
                  Ming{-}Han Yang and
                  Yu{-}Tien Wu and
                  Ta{-}Chun Chien and
                  Chih{-}Wei Lai and
                  Shih{-}Chi Tsai and
                  Wen{-}Ting Chu and
                  Arthur Hung},
  title        = {Demonstration of High Endurance Capability on Mega-Bit {RRAM} Macro
                  and Model of ppm Level Failures},
  booktitle    = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
  pages        = {318--319},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830374},
  doi          = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830374},
  timestamp    = {Thu, 04 Aug 2022 11:27:04 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsit/YangWSYYWCLTCH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}