BibTeX record conf/vlsit/DongSYLXLCWWZWR23

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@inproceedings{DBLP:conf/vlsit/DongSYLXLCWWZWR23,
  author       = {Zuoyuan Dong and
                  Zixuan Sun and
                  Xin Yang and
                  Xiaomei Li and
                  Yongkang Xue and
                  Chen Luo and
                  Puyang Cai and
                  Zirui Wang and
                  Shuying Wang and
                  Yewei Zhang and
                  Chaolun Wang and
                  Pengpeng Ren and
                  Zhigang Ji and
                  Xing Wu and
                  Runsheng Wang and
                  Ru Huang},
  title        = {Catching the Missing {EM} Consequence in Soft Breakdown Reliability
                  in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout
                  Dependence},
  booktitle    = {2023 {IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits), Kyoto, Japan, June 11-16, 2023},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185380},
  doi          = {10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185380},
  timestamp    = {Fri, 22 Dec 2023 22:53:37 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsit/DongSYLXLCWWZWR23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}