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BibTeX record conf/vlsit/DongSYLXLCWWZWR23
@inproceedings{DBLP:conf/vlsit/DongSYLXLCWWZWR23, author = {Zuoyuan Dong and Zixuan Sun and Xin Yang and Xiaomei Li and Yongkang Xue and Chen Luo and Puyang Cai and Zirui Wang and Shuying Wang and Yewei Zhang and Chaolun Wang and Pengpeng Ren and Zhigang Ji and Xing Wu and Runsheng Wang and Ru Huang}, title = {Catching the Missing {EM} Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence}, booktitle = {2023 {IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology and Circuits), Kyoto, Japan, June 11-16, 2023}, pages = {1--2}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185380}, doi = {10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185380}, timestamp = {Mon, 03 Jun 2024 16:30:04 +0200}, biburl = {https://dblp.org/rec/conf/vlsit/DongSYLXLCWWZWR23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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