DBLP Record 'conf/vlsid/YanS05'

BibTeX

@inproceedings{DBLP:conf/vlsid/YanS05,
  author    = {Haihua Yan and
               Adit D. Singh},
  title     = {A Delay Test to Differentiate Resistive Interconnect Faults
               from Weak Transistor Defects},
  booktitle = {VLSI Design},
  year      = {2005},
  pages     = {47-52},
  ee        = {http://csdl.computer.org/comp/proceedings/vlsid/2005/2264/00/22640047abs.htm},
  crossref  = {DBLP:conf/vlsid/2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vlsid/2005,
  title     = {18th International Conference on VLSI Design (VLSI Design
               2005), with the 4th International Conference on Embedded
               Systems Design, 3-7 January 2005, Kolkata, India},
  booktitle = {VLSI Design},
  publisher = {IEEE Computer Society},
  year      = {2005},
  isbn      = {0-7695-2264-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}