A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS.

Suresh Srinivasan Sanu Mathew Vasantha Erraguntla Ram Krishnamurthy A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS. 301-306 2009 VLSI Design http://dx.doi.org/10.1109/VLSI.Design.2009.69 conf/vlsid/2009 db/conf/vlsid/vlsid2009.html#SrinivasanMEK09